News, prizes and awards

  • 2021 Opti-Cal presents its services in an "Insight" feature on the website of Nanoscribe GmbH&Co KG, the provider of our fabrication technology.
  • 2020 Innovation Award of the State of Rhineland-Palatinate in the category 3D printing. The award ceremony can be viewed again here (in German only).

Scientific publications

  1. M. Eifler, J. Hering, G. Bulun, G. von Freymann, J. Seewig: Determination of the characteristics of a self-built coherence scanning interferometer with a universal calibration artefact, Proc. SPIE 12223, Interferometry XXI, 122230A (2022); https://doi.org/10.1117/12.2633483
  2. N. Lang, S. Enns, J. Hering, and G. von Freymann, "Towards efficient structure prediction and pre-compensation in multi-photon lithography," Opt. Express 30, 28805-28816 (2022)

  3. Dai, G.; Hu, X.; Hering, J.; Eifler, M.; Seewig, J.; von Freymann, G.: Define and measure the dimensional accuracy of two-photon laser lithography based on its instrument transfer function, Journal of Physics: Photonics, 3(3), 2021, S. 034000
  4. Eifler, M.; Hering, J.; Keksel, A.; von Freymann, G.; Seewig, J.: Towards a continuous frequency band chirp material measure for surface topography measuring instrument calibration, Proc. SPIE Vol. 11782, Optical Measurement Systems for Industrial Inspection XII; 117820M, 2021
  5. Gross, K.; Eifler, M.; Hering, J.; von Freymann, G.; Seewig, J.: Metrological characteristics of material measures depending on manufacturing parameters in direct laser writing and external stress factors, Proc. SPIE Vol. 11782, Optical Measurement Systems for Industrial Inspection XII; 117820M, 2021 Bulun, G.; Eifler, M.; Hering, J.; von Freymann, G.; Seewig, J.: Performance specification of areal surface texture instruments exemplified by a self-built WLI, Proc. SPIE Vol. 11490, Interferometry XX; 114900H, 2020
  6. Eifler, M.; Hering, J.; Seewig, J.; Leach, R.K.; von Freymann, G.; Hu, X.; Dai, G.: Comparison of material measures for areal surface topography measuring instrument calibration, Surface Topography: Metrology and Properties, 8(2), 2020, S. 025019
  7. Eifler, M.; Ströer, F.; Hering, J.; von Freymann, G.; Seewig, J.: User-oriented evaluation of the metrological characteristics of areal surface topography measuring instruments, Proc. SPIE Vol. 11056Y, Optical Measurement Systems for Industrial Inspection XI; 11056Y, 2019.
  8. Eifler, M.; Hering, J.: Universalnormal zur Überprüfung metrologischer Eigenschaften – Eines für alle. Quality Engineering 01.2019, S. 36-37.
  9. Eifler, M.; Hering, J.; Ströer, F.; Seewig, J.; von Freymann, G.: Flächenhafte Messgeräte mit nur einer Probe kalibrieren. Mikroproduktion 02/2018, S. 22-25.
  10. Seewig, J.; Eifler, M.; Bauer, W.: Praxisgerechte Kalibrierung nach ISO 25178-700 - Eine Übersicht. 2. VDI-Fachtagung Multisensorik in der Fertigungsmesstechnik 2018, VDI-Berichte 2326, S. 213-216.
  11. Eifler, M.; Hering, J.; von Freymann, G.; Seewig, J.: Calibration sample for arbitrary metrological characteristics of optical topography measuring instruments. Optics Express, (26) 2018, 13, S. 16609-16623
  12. Eifler, M.; Hering, J.; von Freymann, G.; Seewig, J.: Manufacturing of the ISO 25178-70 material measures with direct laser writing: a feasibility study. Surface Topography: Metrology and Properties, (6) 2018, S. 024010
  13. Hering, J.; Eifler, M.; Hofherr, L.; Ziegler, C.; Seewig, J.; von Freymann G.: Two-photon laser lithography in optical metrology, Proc. SPIE Vol. 10544, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XI, 1054412, 2018.
  14. Ströer, F.; Hering, J.; Eifler, M.; Raid, I.; von Freymann, G.; Seewig, J.: Ultrafast 3D high precision print of micro structures for optical instrument calibration procedures, Additive Manufacturing (18), 2017, S. 22-30.
  15. Seewig, J.; Eifler, M.: Calibration of areal surface topography measuring instruments. Proc. SPIE 10449, Fifth International Conference on Optical and Photonics Engineering, 1044911, 2017.
  16. Eifler, M.; Seewig, J.; Hering, J.; von Freymann, G.: Calibration of z-axis linearity for arbitrary optical topography measuring instruments, Proceedings of SPIE 9525-163, Optical Measurement Systems for Industrial Inspection IX, 22.-25. Juni 2015, München